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Acadlore takes over the publication of IJCMEM from 2025 Vol. 13, No. 3. The preceding volumes were published under a CC BY 4.0 license by the previous owner, and displayed here as agreed between Acadlore and the previous owner. ✯ : This issue/volume is not published by Acadlore.

Open Access
Research article

Electron Backscatter Diffraction Crystal Morphology Analysis and Multiscale Simulation of Piezoelectric Materials

y. uetsuji1,
H. Kuramae2,
K. Tsuchiya3,
m. kamlah4
1
Department of Mechanical Engineering, Osaka Institute of Technology, Japan
2
Department of Technology Management, Osaka Institute of Technology, Japan
3
Department of Precision Engineering, Tokai University, Japan
4
Institute for Applied Materials, Karlsruhe Institute of Technology, Germany
International Journal of Computational Methods and Experimental Measurements
|
Volume 1, Issue 2, 2013
|
Pages 199-211
Received: N/A,
Revised: N/A,
Accepted: N/A,
Available online: N/A
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Abstract:

A computational approach based on electron backscatter diffraction (EBSD) measurement was proposed to estimate the effects of crystal morphology on the overall response of polycrystalline piezoelectric ceramics. EBSD-measured crystal orientations of a polycrystalline piezoelectric ceramic, barium titanate, were applied to a multiscale finite element simulation based on asymptotic homogenization theory. First, the orientation dependence of material properties, such as elastic compliance constants, dielectric and piezoelectric strain constants, was discussed for a single-domain crystal of tetragonal perovskite structure. The computation indicated that piezoelectric strain constants are more sensitive to crystal orientation compared with other properties. Then the single-crystalline material properties were introduced into multidirectionally oriented grains in the polycrystalline microstructure, the multiscale finite element analysis between macrostructure and EBSD-measured microstructure was performed. In this paper emphasis was placed on the diminution of microstructure. The authors discussed about the adverse effect on each component of macrostructural homogenized material properties, which is useful for micromechanics approaches.

Keywords: EBSD, homogenization, multiscale simulation, piezoelectric material, polycrystalline


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Uetsuji, Y., Kuramae, H., Tsuchiya, K., & Kamlah, M. (2013). Electron Backscatter Diffraction Crystal Morphology Analysis and Multiscale Simulation of Piezoelectric Materials. Int. J. Comput. Methods Exp. Meas., 1(2), 199-211. https://doi.org/10.2495/CMEM-V1-N2-199-211
Y. Uetsuji, H. Kuramae, K. Tsuchiya, and M. Kamlah, "Electron Backscatter Diffraction Crystal Morphology Analysis and Multiscale Simulation of Piezoelectric Materials," Int. J. Comput. Methods Exp. Meas., vol. 1, no. 2, pp. 199-211, 2013. https://doi.org/10.2495/CMEM-V1-N2-199-211
@research-article{Uetsuji2013ElectronBD,
title={Electron Backscatter Diffraction Crystal Morphology Analysis and Multiscale Simulation of Piezoelectric Materials},
author={Y. Uetsuji and H. Kuramae and K. Tsuchiya and M. Kamlah},
journal={International Journal of Computational Methods and Experimental Measurements},
year={2013},
page={199-211},
doi={https://doi.org/10.2495/CMEM-V1-N2-199-211}
}
Y. Uetsuji, et al. "Electron Backscatter Diffraction Crystal Morphology Analysis and Multiscale Simulation of Piezoelectric Materials." International Journal of Computational Methods and Experimental Measurements, v 1, pp 199-211. doi: https://doi.org/10.2495/CMEM-V1-N2-199-211
Y. Uetsuji, H. Kuramae, K. Tsuchiya and M. Kamlah. "Electron Backscatter Diffraction Crystal Morphology Analysis and Multiscale Simulation of Piezoelectric Materials." International Journal of Computational Methods and Experimental Measurements, 1, (2013): 199-211. doi: https://doi.org/10.2495/CMEM-V1-N2-199-211
Uetsuji Y., KURAMAE H, TSUCHIYA K, et al. Electron Backscatter Diffraction Crystal Morphology Analysis and Multiscale Simulation of Piezoelectric Materials[J]. International Journal of Computational Methods and Experimental Measurements, 2013, 1(2): 199-211. https://doi.org/10.2495/CMEM-V1-N2-199-211